Test of the scaling theory in two dimensions in the presence of valley splitting and intervalley scattering in Si-MOSFETs
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Punnoose, Alexander; Finkel’stein, Alexander M.; Mokashi, A.; Kravchenko, S. V. (2010). Test of the scaling theory in two dimensions in the presence of valley splitting and intervalley scattering in Si-MOSFETs. Physical Review B - Condensed Matter and Materials Physics. Available electronically from https : / /hdl .handle .net /1969 .1 /180428.