Browsing by Subject "delay test"
Now showing items 1-3 of 3
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(2015-04-27)This research describes an approach to test metastability of flip-flops with help of multiple at-speed capture cycles during delay test. K longest paths per flip-flop test patterns are generated, such that a long path on ...
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(Texas A&M University, 2006-04-12)Delay test in nano-scale VLSI circuits becomes more difficult with shrinking technology feature sizes and rising clock frequencies. In this dissertation, we study three challenging issues in delay test: fault modeling, ...
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(2012-02-14)Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of functional testing has driven the industry to automatically-generated ...