Automatic Testing Of Integrated Circuits
Abstract
Two projects are discussed. First, automatic control of an SPI-C Wafer Prober via an HP 9845 computer for the purpose of testing selected die locations on an integrated circuit wafer is discussed. Included are discusions of two alternative control schemes and the documentation of the necessary alterations and software for scheme implemented.
Secondly, automated measurement of the parameters of Bipolar Junction Transistors (BJT°s) is discussed. The relationships making measurements possible and the experimental setup and algorithms used are considered. Also, some examples of the experimental results are given.
Description
Program year: 1981/1982Digitized from print original stored in HDR
Citation
Bassett, Paul D. (1982). Automatic Testing Of Integrated Circuits. University Undergraduate Fellow. Available electronically from https : / /hdl .handle .net /1969 .1 /CAPSTONE -DoverS _1982.