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dc.creatorWendt, S.
dc.creatorOzensoy, E.
dc.creatorWei, T.
dc.creatorFrerichs, M.
dc.creatorCai, Y.
dc.creatorChen, M. S.
dc.creatorGoodman, D. W.
dc.date.accessioned2019-10-09T16:19:15Z
dc.date.available2019-10-09T16:19:15Z
dc.date.issued2005
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1969.1/180426
dc.format.extent0en
dc.publisherPhysical Review B - Condensed Matter and Materials Physics
dc.relation.ispartof1foldr Import 2019-10-08 Batch 5en
dc.relation.uri10.1103/PhysRevB.72.115409en
dc.titleElectronic and vibrational properties of ultrathin Si O 2 films grown on Mo(112)en


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