Browsing by Subject "BICS"
Now showing items 1-2 of 2
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(Texas A&M University, 2004-09-30)IDDQ testing has been a very useful test screen for CMOS circuits. However, with each technology node the background leakage of chips is rapidly increasing. As a result it is becoming more difficult to distinguish between ...
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(Texas A&M University, 2006-04-12)Quiescent current leakage test of the VDD supply (IDDQ Test) has been proven an effective way to screen out defective chips in manufacturing of Integrated Circuits (IC). As technology advances, the traditional IDDQ test ...