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Error rate and power dissipation in nano-logic devices
(Texas A&M University, 2004)
Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal ...
Electronic noise in nanostructures: limitations and sensing applications
(Texas A&M University, 2007-04-25)
Nanostructures are nanometer scale structures (characteristic length less than 100 nm) such as
nanowires, ultra-small junctions, etc. Since nanostructures are less stable, their characteristic
volume is much smaller compared ...
Error rate and power dissipation in nano-logic devices
(Texas A&M University, 2005-08-29)
Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal ...