Error rate and power dissipation in nano-logic devices
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Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 100 million elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of single electron transistor is predicted when a single electron logic processor with the a billion single electron transistors works without error at room temperature.
Kim, Jong Un (2003). Error rate and power dissipation in nano-logic devices. Master's thesis, Texas A&M University. Texas A&M University. Available electronically from