Browsing by Subject "power supply noise"
Now showing items 1-3 of 3
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(2009-05-15)As technology scales into the Deep Sub-Micron (DSM) regime, circuit designs have become more and more sensitive to power supply noise. Excessive noise can significantly affect the timing performance of DSM designs and cause ...
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(2012-02-14)Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of functional testing has driven the industry to automatically-generated ...
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(2009-06-02)As semiconductor technology is scaled and voltage level is reduced, the impact of the variation in power supply has become very significant in predicting the realistic worst-case delays in integrated circuits. The analysis ...