Browsing by Subject "ATPG"
Now showing items 1-9 of 9
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(2013-12-10)This dissertation focuses on improving the accuracy and efficiency of path delay test generation using a Boolean satisfiability (SAT) solver. As part of this research, one of the most commonly used SAT solvers, MiniSat, ...
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(2022-04-04)The electronic industry has evolved at a mindboggling pace over the last five decades. Moore’s Law [1] has enabled the chip makers to push the limits of the physics to shrink the feature sizes on Silicon (Si) wafers over ...
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(2016-08-04)Scan-based delay test achieves high fault coverage due to its improved controllability and observability. This is particularly important for our K Longest Paths Per Gate (KLPG) test approach, which has additional necessary ...
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(2018-05-17)As more low power devices are needed for applications such as Internet of Things, reducing power and area is becoming more critical. Reducing power consumption and area caused by full scan design-for-test should be considered ...
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(2012-02-14)Test power is an important issue in deep submicron semiconductor testing. Too much power supply noise and too much power dissipation can result in excessive temperature rise, both leading to overkill during delay test. ...
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(2013-05-01)The ever increasing complexity and size of digital circuits complemented by Deep Sub Micron (DSM) technology trends today pose challenges to the efficient Design For Test (DFT) methodologies. Innovation is required not ...
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(2013-07-29)Memory arrays cannot be as easily tested as other storage elements in a chip. Most of the flip-flops (FFs) in a chip can be replaced by scan cells in scan-based design. However, the bits in memory arrays cannot be replaced ...
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(2016-08-02)With continuous improvements in CMOS technology, transistor sizes are shrinking aggressively every year. Unfortunately, such deep submicron process technologies are severely degraded by several wearout mechanisms which ...
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(2012-02-14)Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of functional testing has driven the industry to automatically-generated ...