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dc.creatorChemaly, Ephrem A.
dc.date.accessioned2013-03-13T21:09:37Z
dc.date.available2013-03-13T21:09:37Z
dc.date.created1986-12
dc.date.issued2013-03-13
dc.identifier.urihttps://hdl.handle.net/1969.1/PILO-TAMU-4019381
dc.description"Submitted to the Graduate College of Texas A&M University in partial fulfillment of the requirement for the degree of Doctor of Engineering."en
dc.descriptionIncludes bibliographical referencesen
dc.description.abstractAs competition gets tighter in the industrial world, many manufacturers are switching from the classical labor intensive methods of production to more sophisticated techniques using automation. At the microprocessor division of Motorola Inc. this approach was taken in a systematic manner. An automation group was founded with the ultimate goal of automating the testing procedures of their product. This testing procedure consists of two major tasks. First an electrical test is performed on the microprocessors to insure that they meet the required electrical specifications. Second a visual inspection of the packages is undertaken to reject the parts with surface flows, such as bubbles, blisters, chips, cracks, and voids. The latter inspection will be of interest to us in this dissertation. The purpose of this work is to perform the visual inspection automatically. The method used is image processing. In particular mathematical morphology is viable because it is the study of shapes. As we will find in this report, defects are merely abnormal shapes of the packages.en
dc.format.mediumelectronicen
dc.format.mimetypeapplication/pdf
dc.languageen_US
dc.publisherTexas A&M University
dc.rightsThis student work was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2012. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use.en
dc.subjectMajor Electrical Engineeringen
dc.subjectElectrical Engineeringen
dc.subject.lcshMotorola, inc.en
dc.subject.lcshElectrical engineering - Texas - Austinen
dc.subject.lcshMicroprocessors- Texas - Austin - Design and constructionen
dc.subject.lcshQuality control - Texas - Austin - Optical methodsen
dc.subject.lcshImage processing - Mathematicsen
dc.subject.lcshIntegrated circuits - Inspection Automationen
dc.titleFourth optical inspection of integrated circuits using image processing and mathematical morphology: a reporten
dc.typeThesisen
dc.typeStudent Projecten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorTexas A&M Universityen
thesis.degree.nameDoctor of Engineeringen
thesis.degree.levelDoctoralen
dc.type.genreInternship Reporten
dc.type.genrethesisen
dc.type.materialtexten
dc.format.digitalOriginreformatted digitalen


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