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Error rate and power dissipation in nano-logic devices
dc.creator | Kim, Jong Un | |
dc.date.accessioned | 2012-06-07T23:21:53Z | |
dc.date.available | 2012-06-07T23:21:53Z | |
dc.date.created | 2004 | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://hdl.handle.net/1969.1/ETD-TAMU-2004-THESIS-K35 | |
dc.description | Due to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to digital@library.tamu.edu, referencing the URI of the item. | en |
dc.description | Includes bibliographical references (leaves 22-23). | en |
dc.description | Issued also on microfiche from Lange Micrographics. | en |
dc.description.abstract | Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 10⁸ elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of a single electron transistor is predicted when a single electron logic processor with the 10⁹ single electron transistors works without error at room temperature. | en |
dc.format.medium | electronic | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.publisher | Texas A&M University | |
dc.rights | This thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2008. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use. | en |
dc.subject | electrical engineering. | en |
dc.subject | Major electrical engineering. | en |
dc.title | Error rate and power dissipation in nano-logic devices | en |
dc.type | Thesis | en |
thesis.degree.discipline | electrical engineering | en |
thesis.degree.name | M.S. | en |
thesis.degree.level | Masters | en |
dc.type.genre | thesis | en |
dc.type.material | text | en |
dc.format.digitalOrigin | reformatted digital | en |
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