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Stopping power measurements of 20-180 keV ¹H and ⁴He in Indium Phosphide using thick target backscattering
dc.contributor.advisor | Hart, Ron R. | |
dc.creator | Lee, Stephen Roger | |
dc.date.accessioned | 2020-09-02T21:04:43Z | |
dc.date.available | 2020-09-02T21:04:43Z | |
dc.date.issued | 1986 | |
dc.identifier.uri | https://hdl.handle.net/1969.1/DISSERTATIONS-22943 | |
dc.description | Typescript (photocopy). | en |
dc.description.abstract | The stopping power of InP for 20-180 keV 1H and 4He was determined by measuring the absolute backscattering yield of thick InP targets. Several nonideal aspects of surface barrier detectors were observed which should be accounted for when making low to medium energy backscattering yield measurements. These are: non-Gaussian detector resolution, nonlinear detector energy calibration, and ion reflection in the detector Au window. The present 1H in InP stopping cross section measurements are in good agreement with those recently obtained by Khodyrev et al. using a relative, bulk yield, single spectrum approach. The 4He in InP stopping cross section measurements were found to be velocity proportional below 30 keV/amu. The estimated standard error of the measurements is + 7% at 20 keV and + 4% at 180 keV. | en |
dc.format.extent | viii, 94 leaves | en |
dc.format.medium | electronic | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | |
dc.rights | This thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use. | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
dc.subject | Major nuclear engineering | en |
dc.subject.classification | 1986 Dissertation L481 | |
dc.subject.lcsh | Stopping power (Nuclear physics) | en |
dc.subject.lcsh | Backscattering | en |
dc.subject.lcsh | Indium compounds | en |
dc.title | Stopping power measurements of 20-180 keV ¹H and ⁴He in Indium Phosphide using thick target backscattering | en |
dc.type | Thesis | en |
thesis.degree.grantor | Texas A&M University | en |
thesis.degree.name | Doctor of Philosophy | en |
thesis.degree.name | Ph. D | en |
dc.contributor.committeeMember | Erdman, Carl A. | |
dc.contributor.committeeMember | Ernst, David J. | |
dc.contributor.committeeMember | Parish, Theodore A. | |
dc.type.genre | dissertations | en |
dc.type.material | text | en |
dc.format.digitalOrigin | reformatted digital | en |
dc.publisher.digital | Texas A&M University. Libraries | |
dc.identifier.oclc | 18011918 |
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