Abstract
An analysis of the noise in iodine was made. The spectral intensities were observed directly between 20 and 500 cps using a wave analyzer to provide the Fourier amplitudes. The spectral intensities between .025 and 10 cps were calculated from autocorrelation function that were obtained from photographs of oscilloscope truces. This analysis indicated considerable low frequency noise of the form V³/f² with some structure at the lowest frequencies. There were large spatial and long time correlations present, and the noise increased exponentially with temperature. It was assumed that the noise was due to a breakdown phenomena. This phenomena could explain the increased noise and its temperature dependence. The extended carrier lifetime is thought to be the result of the excess charge filling the trapping centers. Making a reasonable fit to the spectra with the shot spectra formula, mobilities of 0.2 and 0.3 cm²/volt-sec were calculated. Cross-correlation analysis yield a mobility of 1.3 cm²/volt-sec.
Caruthers, Jerald Wayne (1968). Fluctuation phenomena in iodine. Doctoral dissertation, Texas A&M University. Texas A&M University. Libraries. Available electronically from
https : / /hdl .handle .net /1969 .1 /DISSERTATIONS -171657.