Improving microwave circuit testing and producibility with statistical techniques

Abstract

Significant improvements to microwave circuits can be made through the use of statistical methods. This dissertation addresses three aspects of the microwave circuit design process: Modeling, Design Methodology, and Circuit Verification. Advanced statistical modeling methodology was developed for improved active device variation modeling. Design of Experiments techniques were applied to the microwave design process within the Computer Aided Design environment to systematically achieve circuit design goals and reduce performance variation. A new technique based on bilinear transformations was developed which helps quantify potential variation in a S-parameter network. Finally, statistical calibration was applied to the testing process so that wafer probe equipment could be used to obtain measurements for a fixtured environment. Each of these design tool enhancements allow microwave engineer designer to produce circuits that exhibit less performance variability and greater wafer yield in less amount of time.