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dc.creatorAssad, Chahriar Bakhtiari
dc.description.abstractThe interaction of highly charged ions with surfaces causes the emission of secondary electrons. Measurements have been made of the electron emissions from Ag and NaCl targets, due to bombardment with multiply charge Ar ions. Ions beams that were used areAr+2 , Ar +4 , Ar +6 , Ar+8, and Ar+9 at 24 keV, Ar +4 1 Ar +6 Ar +8, Ar+9, and Ar+ll at 48 keV, and Ar +8 , Ar+91 Ar+ll I and Ar+13 at 96 keV. Energy spectra of the emitted electrons reveal Ag M Augers and Ar L Augers for the silver target, and Cl L Augers and Ar L Augers (only for high charge states) for the NaCl target.en
dc.format.extentxi, 125 leavesen
dc.rightsThis thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use.en
dc.subjectMajor physicsen
dc.subject.classification1994 Dissertation A844
dc.titleCharge neutralization processes between highly charged ions and surfacesen
dc.typeThesisen A&M Universityen of Philosophyen Den
dc.format.digitalOriginreformatted digitalen
dc.publisher.digitalTexas A&M University. Libraries

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