Browsing University Libraries by Subject "G01B 9/02044"
Now showing items 1-1 of 1
(United States. Patent and Trademark OfficeTexas A&M University. Libraries, 2010-02-02)The present relates generally to methods, systems and apparatuses for three dimensional and cross-sectional imaging of objects (e.g., silicon) and subjects at a nanometer-scale resolution using short wave-length (e.g., ...