Approaches to test set generation using binary decision diagrams
Abstract
This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods, such as probability of random detection and test-space overlap between faults. I have created a software tool that performs experiments to make such measurements and augments existing test generation strategies with this new information. Using this tool, I explored the relationship of fault model difficulty to test set length through fortuitous detection, and I experimented with the application of function-based methods to help reconcile the traditionally opposed goals of making test sets that are both smaller and more effective.
Subject
binary decision diagramBDD
digital logic test
test generation
function-based test generation
Citation
Wingfield, James (2003). Approaches to test set generation using binary decision diagrams. Master's thesis, Texas A&M University. Texas A&M University. Available electronically from https : / /hdl .handle .net /1969 .1 /20.