| dc.description.abstract | In our ever-modern society, semiconductor devices are becoming increasingly common throughout the average person's daily life. These ordinary people go along with their days not thinking about the effect of how their lives might change if one of these devices were not designed in their original format but instead tampered with by bad actors who either refurbished used chips and labeled them as new or installed hardware trojans that can render the device inoperational. This research aims to find and eliminate these dangerous devices from the supply by detecting their abnormal behavior. The research is set up to perform DOE or Design of Experiments analysis to characterize the effects four input factors have on the operation of MSP430 microcontrollers in six different types of responses. The four input factors that are considered in this paper are Voltage Common Collector (Vcc, also known as Supply Voltage), Temperature, Humidity, and Age. The measured output responses are VIL, VIH, VOL, VOH, and two types of power consumption. A set of chips were accelerated at approximately 10 and 20 years old through increased temperature and Supply voltage. Overall, this research determined that Supply Voltage was the most significant of the four input factors, with temperature coming in second place. Throughout the course of this research, it was also determined that output load might be an important factor that was not integrated into the DOE analysis. | |
