| dc.description.abstract | As the demand for microchips to control a more technologically connected world increases, so does the outsourcing of manufacturing these microchips, which poses risks of old microchips being refurbished as new and new microchips being tampered with Hardware Trojans (HT). The purpose of this research is to develop a systematic testing approach to analyze various microchips for abnormal behaviors. The Design of Experiments (DOE) technique was used to investigate the effects of temperature, humidity, and supply voltage (VCC) on microchip response parameters of VOL, VOH, VIL, VIH, and power consumption values. All these parameters were also individually examined against supply voltage under various temperature and humidity conditions on ten different MSP430FG6626s in 2 separate tests to determine Chip to Chip (C-2-C) variation, microchip defects and potential failures. A sealed enclosure was created to achieve various needed testing conditions and to allow for multiple chips to be tested simultaneously. Corresponding devices were equipped to the enclosure for in-situ input variation and output recording. DOE analysis concluded that supply voltage is the most statistically significant factor affecting key microchip response parameters of VIL, VIH and VOH within the limits of the input factors. The high repeatability and consistency of the response data to supply voltage ramping among the tested chips confirm that the testing setup and method used in this research are valid for screening microchips for defects and irregularities. | |
