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dc.contributor.otherERM Midwest & ERM Gulf
dc.creatorHawkins, Steve
dc.creatorIsrani, Chris
dc.date.accessioned2021-06-11T18:55:50Z
dc.date.available2021-06-11T18:55:50Z
dc.date.issued2018
dc.identifier.urihttps://hdl.handle.net/1969.1/193452
dc.descriptionPresentationen
dc.description.abstractMost semiconductor manufacturing facilities do not contain quantities of highly hazardous chemicals in threshold quantities sufficient to be subject to the Occupational Health and Safety Administration's (OSHA) Process Safety Management (PSM) regulations. However, some organizations are applying Risk Based Process Safety (RBPS) concepts as a systematic means to not only ensure EHS risks are identified and quantified, but also to strengthen overall business performance and provide competitive advantages. Aging Fabrication facilities and infrastructure, their ever-increasing production demands, rapid innovation and need for process modifications are also business drivers for RBPS. The core RBPS concepts not only provide a holistic approach to protect employees from catastrophic accidents and releases; but in most cases also drive production efficiencies, increase equipment/tool reliability and life span, promote quality improvements, and enhance business continuity measures. This is accomplished by application of a wide range of process safety management elements, as applicable to semiconductor operations, which fall under the following four basic pillars of RBPS: Process Safety Leadership/Commitment; Risk Assessment/Identification; Risk Management; and Learning and Continuous Improvement. This session will discuss the basic concepts of RBPS, including a brief review of the 20 elements as provided by the Center for Chemical Process Safety (CCPS) framework, and present the benefits of developing and implementing process safety management systems for semiconductor processes. Case studies will be presented, as applicable, to detail the advantages, as well as the challenges, of RBPS for the semiconductor industry.en
dc.format.extent1 pageen
dc.languageeng
dc.publisherMary Kay O'Connor Process Safety Center
dc.relation.ispartofMary K O'Connor Process Safety Symposium. Proceedings 2018.en
dc.rightsIN COPYRIGHT - EDUCATIONAL USE PERMITTEDen
dc.rights.urihttp://rightsstatements.org/vocab/InC-EDU/1.0/
dc.subjectSemiconductor Fabrication Operationsen
dc.titleRisk Based Process Safety for Semiconductor Fabrication Operationsen
dc.type.genrePapersen
dc.format.digitalOriginborn digitalen
dc.publisher.digitalTexas &M University. Libraries


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