Automatic Temperature Control System for Semiconductor Devices During Radiation Testing

Abstract

The proposed project focuses on the issue of inaccurate temperature control in a critical environment. Currently, there are two options with respect to radiation testing, in house radiation testing, or traveling to third party locations. In house radiation testing gives the ability to build temperature control environments around the beam. However, traveling to third party locations requires setups that must be portable and flexible in order to be used from place to place. A current temperature control system in use does not have the capability to achieve precise temperatures, as well as the need for manual implementation of the system to adjust the voltage line of the radiator. The current system operates with open loop control, meaning there is no automated feedback for adjustments. For an optimal control system in the radiation environment a Proportional-Integral-Derivative (PID) Omega Controller will be calibrated to achieve setpoint fluctuations of no more than ± 1 ℃. The Omega Controller’s temperature control will then be compared to the current open loop control system for to determine the difference of temperature control. After comparing the data between the two setups, a thermal camera will be implemented as part of the Omega control system. A thermal camera will use infrared imaging technology to conduct temperature measurements to a similar accuracy of the currently used type K thermocouple wire. The thermal camera measurements will act as a non-contact test method to measure true chip temperatures rather than output air temperatures. The data acquisition, comparison, and proposed end system will be presented in the following thesis.