Condition assessment and life expectancy prediction for devices

dc.creator	Parlos, Alexander G.
dc.date.accessioned	2019-06-17T17:00:42Z
dc.date.available	2019-06-17T17:00:42Z
dc.date.issued	2006-04-04
dc.identifier.uri	https://hdl.handle.net/1969.1/176814
dc.description.abstract	Assessing the condition of a device includes receiving signals from a sensor that makes electrical measurements of the device. An expected response of the device is estimated in accordance with the received signals, and a measured response of the device is established in accordance with the received signals. An output residual is calculated according to the expected response and the measured response. The condition of the device is assessed by identifying a fault of the device in accordance with the output residual.	en
dc.language	eng
dc.publisher	United States. Patent and Trademark Office
dc.rights	Public Domain (No copyright - United States)	en
dc.rights.uri	http://rightsstatements.org/vocab/NoC-US/1.0/
dc.title	Condition assessment and life expectancy prediction for devices	en
dc.type	Utility patent	en
dc.format.digitalOrigin	reformatted digital	en
dc.description.country	US
dc.contributor.assignee	The Texas A&M University System
dc.identifier.patentapplicationnumber	10/628071
dc.subject.uspcprimary	702/182
dc.subject.uspcother	700/30
dc.subject.uspcother	700/31
dc.subject.uspcother	700/52
dc.date.filed	2003-07-25
dc.publisher.digital	Texas A&M University. Libraries
dc.subject.cpcprimary	G05B 23/0254
dc.subject.cpcprimary	G05B 23/0283