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dc.creatorGillig, Kent J.
dc.creatorRussell, David H.
dc.date.accessioned2019-06-17T16:57:54Z
dc.date.available2019-06-17T16:57:54Z
dc.date.issued2003-10-28
dc.identifier.urihttps://hdl.handle.net/1969.1/176741
dc.description.abstractThis invention is generally in the field of improved ion mobility spectrometry. The improvement lies in the use of periodic focusing electric fields that minimize the spatial spread of the migrating ions by keeping them in a tight radius about the axis of travel. The resulting enhancement in sensitivity is accomplished without a concomitant loss in resolution as would normally be expected when non-linear fields are used.en
dc.languageeng
dc.publisherUnited States. Patent and Trademark Office
dc.rightsPublic Domain (No copyright - United States)en
dc.rights.urihttp://rightsstatements.org/vocab/NoC-US/1.0/
dc.titlePeriodic field focusing ion mobility spectrometeren
dc.typeUtility patenten
dc.format.digitalOriginreformatted digitalen
dc.description.countryUS
dc.contributor.assigneeThe Texas A & M University System
dc.contributor.assigneeIonwerks
dc.identifier.patentapplicationnumber09/798032
dc.subject.uspcprimary250/286
dc.subject.uspcother250/281
dc.subject.uspcother250/282
dc.subject.uspcother250/287
dc.subject.uspcother250/288
dc.date.filed2001-02-28
dc.publisher.digitalTexas A&M University. Libraries
dc.subject.cpcprimaryH01J 49/06
dc.subject.cpcprimaryG01N 27/622
dc.subject.cpcprimaryH01J 49/401


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