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dc.contributor.advisorTaylor, Henry F.
dc.creatorLee, Jong-Seo
dc.date.accessioned2004-09-30T01:43:30Z
dc.date.available2004-09-30T01:43:30Z
dc.date.created2003-08
dc.date.issued2004-09-30
dc.identifier.urihttps://hdl.handle.net/1969.1/139
dc.description.abstractAll-fiber multireflector spectral filters which have potential application in optical communications have been investigated experimentally. These multireflector etalons were produced by aligning equal-length fiber sections with TiO2/SiO2 dielectric mirrors deposited on the end in a silicon v-groove. Fiber sections 1.33mm in length were produced by polishing, with the fibers held in a silicon wafer polishing jig. The fibers were aligned inside the polishing jig using a precision micro positioner. Then four polishing steps with increasingly finer grit were applied to produce high-quality polished end surfaces on each fiber section. Finally, a dielectric mirror was deposited on one end of each fiber section by magnetron sputtering. After characterizing the optical loss, length, and mirror reflectance for each of the fiber sections, sections which were well-matched in length were chosen for assembly of the four-mirror etalon, which had nominal reflectance values of 10%, 50%, 50%, and 10% for the dielectric mirrors. Measured transmittance spectra for a mutireflector spectral filter were compared with calculated spectra. Thermal tuning of the multireflector etalon was also investigated. A 0.34 nm wavelength shift was observed for a 23° C temperature change, in agreement with prediction. increasingly finer grit were applied to produce high-quality polished end surfaces on each fiber section. Finally, a dielectric mirror was deposited on one end of each fiber section by magnetron sputtering. After characterizing the optical loss, length, and mirror reflectance for each of the fiber sections, sections which were well-matched in length were chosen for assembly of the four-mirror etalon, which had nominal reflectance values of 10%, 50%, 50%, and 10% for the dielectric mirrors. Measured transmittance spectra for a mutireflector spectral filter were compared with calculated spectra. Thermal tuning of the multireflector etalon was also investigated. A 0.34 nm wavelength shift was observed for a 23° C temperature change, in agreement with prediction.en
dc.format.extent2209780 bytesen
dc.format.mediumelectronicen
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherTexas A&M University
dc.subjectFabry-Peroten
dc.subjectBand pass filteren
dc.subjectoptical filteren
dc.subjectmulti-reflectoren
dc.titleExperimental investigations of an all-fiber multireflector spectral filter for optical communicationsen
dc.typeBooken
dc.typeThesisen
thesis.degree.departmentElectrical Engineeringen
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorTexas A&M Universityen
thesis.degree.nameDoctor of Philosophyen
thesis.degree.levelDoctoralen
dc.contributor.committeeMemberEknoyan, Ohannes
dc.contributor.committeeMemberWang, Li Hong
dc.contributor.committeeMemberChang, Kai
dc.type.genreElectronic Dissertationen
dc.type.materialtexten
dc.format.digitalOriginborn digitalen


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