Browsing by Subject "massive clusters"
Now showing items 1-2 of 2
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Nano-Domain Analysis Via Massive Cluster Secondary Ion Mass Spectrometry in the Event-by-Event Mode (2011-02-22)Secondary ion mass spectrometry (SIMS) is a surface analysis technique which characterizes species sputtered by an energetic particle beam. Bombardment with cluster projectiles offers the following notable advantages over ...
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(Texas A&M University, 2007-09-17)Secondary ion mass spectrometry, SIMS, is one of the most versatile surface analytical techniques. The significant parameter determining the performance of SIMS is the secondary ion yield. Atomic projectiles, traditionally ...