Browsing by Subject "circuit"
Now showing items 1-2 of 2
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(Texas A&M University, 2004-09-30)Good failure analysis is the ability to determine the site of a circuit defect quickly and accurately. We propose a method for defect site prediction that is based on a site's probability of excitation, making no assumptions ...
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(2016-05-09)Traditional automatic test pattern generation achieves high coverage of logic faults in integrated circuits. Automatic test of embedded memory arrays uses built-in self-test. Testing the memories and logic separately does ...