Browsing by Subject "Transistor Ageing Antifuse NBTI negative bias temperature instability FTS Field Transistor Sizing"
Now showing items 1-1 of 1
-
(2010-01-14)Transistor aging through negative bias temperature instability (NBTI) has become a major lifetime constraint in VLSI circuits. We propose a technique that uses antifuses to widen PMOS transistors later in a circuit?s life ...