Browsing by Subject "Secondary ion emission"
Now showing items 1-2 of 2
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(Texas A&M University. Libraries, 1990)A new experimental method has been developed for studying negative secondary ion (SI) emission from solid surfaces bombarded by polyatomic primary ions of 5 to 30 keV. The method is based on the time-of-flight (TOF) analysis ...
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(Texas A&M University. Libraries, 1991)The goal of this study was to explore sample-projectile interactions by examining secondary ion (SI) yields in an event-by-event impact and detection mode. Cluster secondary ion mass spectrometry (SIMS) was evaluated in ...