Now showing items 1-4 of 4

    • Ho, Yenpo (2014-08-27)
      Nowadays, the trend of modern memory technology is going towards the following directions: (1) look for new nonvolatile devices; (2) keep scaling down the existing volatile devices. Although nonvolatile devices enable to ...
    • Ho, Yenpo (2009-05-15)
      In the past decade, aggressive scaling of transistor feature size has been a primary force driving higher Static Random Access Memory (SRAM) integration density. Due to the scaling, nanometer SRAM designs are getting more ...
    • Dayal, Akshit (2011-02-22)
      Technology scaling has been the most obvious choice of designers and chip manufacturing companies to improve the performance of analog and digital circuits. With the ever shrinking technological node, process variations ...
    • Zhao, Chang (2011-02-22)
      Yield analysis is a critical step in memory designs considering a variety of performance constraints. Traditional circuit level Monte-Carlo simulations for yield estimation of Static Random Access Memory (SRAM) cell is ...