Browsing by Subject "Ion bombardment"

Now showing items 1-4 of 4

    • Desorption induced by keV molecular and cluster projectiles 
      Blain, Matthew Glenn (Texas A&M University. Libraries, 1990)
      A new experimental method has been developed for studying negative secondary ion (SI) emission from solid surfaces bombarded by polyatomic primary ions of 5 to 30 keV. The method is based on the time-of-flight (TOF) analysis ...
    • Microlocalization during ion beam analysis 
      Divis, Lynne Marie (Texas A&M University. Libraries, 1985)
      We have investigated three techniques for identifying microregions of the sample examined by an ion beam during analysis. These techniques involve 1) the detection of secondary electrons ejected from the sample during ion ...
    • Radioactivation analysis with heavy ion beams 
      Lass, Bennett David (Texas A&M University. Libraries, 1981)
      Heavy ion activation analysis (HIAA) was evaluated for the determination of low Z elements Z (LESSTHEQ) 8. These target species were bombarded with ion beams of 3 (LESSTHEQ) Z (LESSTHEQ) 8 and energies (TURN) 1 MeV/amu. ...
    • Time-of-flight mass spectrometry with KeV and MeV projectiles using coincidence counting 
      Inman, Mark Estes (Texas A&M University. Libraries, 1991)
      The goal of this study was to explore sample-projectile interactions by examining secondary ion (SI) yields in an event-by-event impact and detection mode. Cluster secondary ion mass spectrometry (SIMS) was evaluated in ...