Browsing by Subject "C60"
Now showing items 1-4 of 4
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Development of Cluster Secondary Ion Mass Spectrometry for Surface Characterization at the Nanoscale (2016-05-10)Cluster secondary ion mass spectrometry (SIMS) operated in the event-by-event bombardment-detection mode has been applied to 1) nanodomain analysis of macromolecular brush architecture; 2) characterization of raw and ...
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(American Physical Society, 1994)
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(Texas A&M University, 2006-10-30)Secondary ion mass spectrometry (SIMS) is a surface analysis technique capable of providing isotopic and molecular information. SIMS uses keV projectiles to impinge upon a sample resulting in secondary ion emission from ...
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(2012-11-06)High resolution mapping of molecular species, specifically sub-micrometer spatial resolution mapping, is at the forefront of recent interest in Secondary Ion Mass Spectrometry (SIMS). Large projectiles, e.g. C60, Au400, ...