Browsing by Subject "C60"
Now showing items 1-4 of 4
Development of Cluster Secondary Ion Mass Spectrometry for Surface Characterization at the Nanoscale (2016-05-10)Cluster secondary ion mass spectrometry (SIMS) operated in the event-by-event bombardment-detection mode has been applied to 1) nanodomain analysis of macromolecular brush architecture; 2) characterization of raw and ...
Electron-Ion Dynamics - a Technique for Simulating both Electronic-Transitions and Ionic Motion in Molecules and Materials (American Physical Society, 1994)
(Texas A&M University, 2006-10-30)Secondary ion mass spectrometry (SIMS) is a surface analysis technique capable of providing isotopic and molecular information. SIMS uses keV projectiles to impinge upon a sample resulting in secondary ion emission from ...
Surface mapping based on the correlated emission of ions and electrons from hypervelocity C60 impacts (2012-11-06)High resolution mapping of molecular species, specifically sub-micrometer spatial resolution mapping, is at the forefront of recent interest in Secondary Ion Mass Spectrometry (SIMS). Large projectiles, e.g. C60, Au400, ...