Browsing by Subject "BIST"
Now showing items 1-2 of 2
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(Texas A&M University, 2007-04-25)The expanding wireless market has resulted in complex integrated transceivers that involve RF, analog and mixed-signal circuits, resulting in expensive and complicated testing. The most important challenges that test ...
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(Texas A&M University, 2004-11-15)The cost to test chips has risen tremendously. Additionally, the process for testing all functionalities of both analog and digital part is far from simple. One attractive option is moving some or all of the testing functions ...