Browsing by Author "Ray, Kevin Bernard"

Now showing items 1-3 of 3

    • Ion source for compact mass spectrometer and method of mass analyzing a sample 
      Da Silveira, Enio Frota; Ray, Kevin Bernard; Schweikert, Emile Alfred; Park, Melvin Andrew (United States. Patent and Trademark Office; Texas A&M University. Libraries, 1997-08-19)
      A mass spectrometer 20 includes an electron multiplier 30 for producing an electron avalanche 58 directed toward an ionization region 38. A sample 40 enters the ionization region 38 through a sample inlet 68. In the ...
    • Ion source for compact mass spectrometer and method of mass analyzing a sample 
      Da Silveira, Enio Frota; Ray, Kevin Bernard; Schweikert, Emile Alfred; Park, Melvin Andrew (United States. Patent and Trademark Office; Texas A&M University. Libraries, 1998-12-22)
      A mass spectrometer 20 includes an electron multiplier 30 for producing an electron avalanche 58 directed toward an ionization region 38. A sample 40 enters the ionization region 38 through a sample inlet 68. In the ...
    • A study of secondary ion correlations using coincidence counting time-of-flight mass spectrometry 
      Ray, Kevin Bernard (Texas A&M University. Libraries, 1994)
      Coincidence counting techniques have been combined with time-of-flight mass spectrometry (TOF-MS) in a study of secondary ion relationships using keV and MeV projectiles. The method is based on analyzing the results of ...