Browsing by Author "Henrichson, Trenton D."
Now showing items 1-1 of 1
-
Henrichson, Trenton D. (2010-01-14)Transistor aging through negative bias temperature instability (NBTI) has become a major lifetime constraint in VLSI circuits. We propose a technique that uses antifuses to widen PMOS transistors later in a circuit?s life ...