Browsing by Author "Dani, Sameer Manohar"
Now showing items 1-1 of 1
-
Dani, Sameer Manohar (Texas A&M University, 1993)Although the majority of defects found in manufacturing lines of Integrated Circuits [ IC's] have predominantly 2- Dimensional [2D] effects, there are many situations in which 2D defect models do not suffice) e.g., tall ...