Browsing by Author "Chakraborty, Avijit"

Now showing items 1-2 of 2

    • Heuristics Based Test Overhead Reduction Techniques in VLSI Circuits 
      Chakraborty, Avijit (2022-04-04)
      The electronic industry has evolved at a mindboggling pace over the last five decades. Moore’s Law [1] has enabled the chip makers to push the limits of the physics to shrink the feature sizes on Silicon (Si) wafers over ...
    • Observability Driven Path Generation for Delay Test 
      Chakraborty, Avijit (2015-11-20)
      This research describes an approach for path generation using an observability metric for delay test. K Longest Path Per Gate (KLPG) tests are generated for sequential circuits. A transition launched from a scan flip-flop ...