Dielectric-Loaded Microwave Cavity for High-Gradient Testing of Superconducting Materials

Abstract

A superconducting microwave cavity has been designed to test advanced materials for use in the accelerating structures contained within linear colliders. The electromagnetic design of this cavity produces surface magnetic fields on the sample wafer exceeding the critical limit of Niobium. The ability of this cavity to push up to 4 times the critical field provides, for the first time, a short sample method to reproducibly test these thin films to their ultimate limit. In order for this Wafer Test cavity to function appropriately, the large sapphire at the heart of the cavity must have specific inherent qualities. A second cavity was constructed to test these parameters: dielectric constant, loss tangent, and heat capacity. Several tests were performed and consistent values were obtained. The consequences of these measurements were then applied to the Wafer Cavity, and its performance was evaluated for different power inputs. The Q_0 of the cavity could be as low as 10^7 because of the sapphire heating, therefore removing the ability to measure nano-resistances. However, with additional measurements in a less complex environment, such as the Wafer Test Cavity, the Q_0 could be higher than 10^9.