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dc.creatorVan Ormer, H.
dc.date.accessioned2007-06-13T15:28:58Z
dc.date.available2007-06-13T15:28:58Z
dc.date.issued2006
dc.identifier.otherESL-IE-06-05-16
dc.identifier.urihttps://hdl.handle.net/1969.1/5631
dc.format.extent487671 bytesen
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherEnergy Systems Laboratory (http://esl.tamu.edu)
dc.publisherTexas A&M University (http://www.tamu.edu)
dc.titleEffects of 'Limited Product Line Audits'en


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