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    • Particle analysis system and method 

      Sevick-muraca, Eva; Pierce, Joseph; Richter, Steven; Shinde, Rajesh; Balgi, Ganesh; Kao, Jeffrey; Jiang, Huabei (United States. Patent and Trademark OfficeTexas A&M University. Libraries, 2007-03-06)
      A system (20) and method are disclosed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction φ of a number of particles (P) dispersed in a medium (M) by detecting one or more propagation ...