Browsing by Subject "NBTI"
Now showing items 1-3 of 3
-
(2009-05-15)VLSI circuits in nanometer VLSI technology experience significant variations - intrinsic process variations and variations brought about by transistor degradation or aging. These are generally embodied by yield loss or ...
-
(2016-08-02)With continuous improvements in CMOS technology, transistor sizes are shrinking aggressively every year. Unfortunately, such deep submicron process technologies are severely degraded by several wearout mechanisms which ...
-
(2015-07-15)Ever since the VLSI process technology crossed the sub-micron threshold, there is an increased interest in design of fault-tolerant systems to mitigate the wearout of transistors. Hot Carrier Injection (HCI) and Negative ...