Browsing by Author "Golovko, V. V."

Now showing items 1-2 of 2

    • Half-life of the electron-capture decay of (97)Ru: Precision measurement shows no temperature dependence 
      Goodwin, J. R.; Golovko, V. V.; Iacob, V. E.; Hardy, John C. (American Physical Society, 2009)
      We have measured the half-life of the electron-capture (ec) decay of (97)Ru in a metallic environment, both at low temperature (19 K), and also at room temperature. We find the half-lives at both temperatures to be the ...
    • Precise half-life measurement of the superallowed beta(+) emitter (26)Si 
      Iacob, V. E.; Hardy, John C.; Banu, A.; Chen, L.; Golovko, V. V.; Goodwin, J.; Horvat, V.; Nica, N.; Park, H. I.; Trache, L.; Tribble, Robert E. (American Physical Society, 2010)
      We measured the half-life of the superallowed 0(+) -> 0(+) beta(+) emitter (26)Si to be 2245.3(7) ms. We used pure sources of (26)Si and employed a high-efficiency gas counter, whichwas sensitive to positrons from both ...