Browsing by Author "Cobb, Bradley Douglas"

Now showing items 1-2 of 2

    • Transition-fault test generation 
      Cobb, Bradley Douglas (Texas A&M University, 2013-02-22)
      After an integrated circuit is manufactured, it must be tested to insure that it is not defective. Specifically, timing defects are becoming increasingly important to detect because of the decreasing process geometries ...
    • Using ordered partial decision diagrams for manufacture test generation 
      Cobb, Bradley Douglas (Texas A&M University, 2004-09-30)
      Because of limited tester time and memory, a primary goal of digital circuit manufacture test generation is to create compact test sets. Test generation programs that use Ordered Binary Decision Diagrams (OBDDs) as their ...