Now showing items 1-1 of 1

    • A Behavioral Model of a Built-in Current Sensor for IDDQ Testing 

      Gharaibeh, Ammar (2010-01-14)
      IDDQ testing is one of the most effective methods for detecting defects in integrated circuits. Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test. One solution is ...