An analysis of test effectiveness via surrogate simulation of a commercial IC
Date
2001
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas A&M University
Abstract
Choosing which test sets to apply to a commercial design is important in order to efficiently achieve low defective part levels. This work compares a test set created by the DO-RE-ME process utilizing the MPG-D defective part level model that maximizes observation at problem sites with a commercial automatic test pattern generation test set that utilizes stuck-at faults to generate tests and to estimate defective part level. Incorporated in this comparison are stuck-at fault predictions, MPG-D predictions, and bridging surrogate simulation results. In contrast to standard commercial practice, the MPG-D model also allows analysis on a fault-by-fault basis and on a pattern-by-pattern basis.
Description
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Includes bibliographical references (leaves 34-36).
Issued also on microfiche from Lange Micrographics.
Includes bibliographical references (leaves 34-36).
Issued also on microfiche from Lange Micrographics.
Keywords
electrical engineering., Major electrical engineering.