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dc.creatorThompson, Kelly
dc.date.accessioned2012-06-07T22:38:49Z
dc.date.available2012-06-07T22:38:49Z
dc.date.created1994
dc.date.issued1994
dc.identifier.urihttps://hdl.handle.net/1969.1/ETD-TAMU-1994-THESIS-T4734
dc.descriptionDue to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to digital@library.tamu.edu, referencing the URI of the item.en
dc.descriptionIncludes bibliographical references.en
dc.description.abstractEfficiencies of a microchannel plate detector for medium energy helium and carbon ions were determined using a recently developed time of flight technique for near surface analysis by medium energy ion scattering. This technique utilizes a pulsed beam of singly charged helium-4 or carbon- 1 2 ions with energies in the 60-140 keV range to provide enhanced energy resolution (1.2% to 2.3%) when compared to conventional Rutherford backscattering techniques using solid state detectors (around 6.5% for helium). Beam pulses having I-2 ns duration were produced by sweeping the ion beam across a 1/8 inch collimator. The microchannel plate detector was mounted at the end of a I meter flight tube. Thin (2 jig/cm'), carbon screening foils mounted on the face of the microchannel plate detector were employed to prevent the low energy component of scattered ions from reaching the detector. The depth resolution for this detector unit was found to be 14-20 A for helium in silicon and 16-22 A for carbon in silicon. The detection efficiency ranged between 24.8% to 27.2% for helium beams and 21.9% to 23.8% for carbon over the energy range examined.en
dc.format.mediumelectronicen
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherTexas A&M University
dc.rightsThis thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2008. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use.en
dc.subjectnuclear engineering.en
dc.subjectMajor nuclear engineering.en
dc.titleCharacterization of a pulsed beam Time-of-Flight system for medium energy He+ and C+ backscattering spectrometryen
dc.typeThesisen
thesis.degree.disciplinenuclear engineeringen
thesis.degree.nameM.S.en
thesis.degree.levelMastersen
dc.type.genrethesisen
dc.type.materialtexten
dc.format.digitalOriginreformatted digitalen


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