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Reliability characterization and prediction of high k dielectric thin film
(Texas A&M University, 2006-04-12)
As technologies continue advancing, semiconductor devices with dimensions in nanometers have entered all spheres of human life. This research deals with both the statistical aspect of reliability and some electrical aspect ...
The impact of misspecifying cross-classified random effects models in cross-sectional and longitudinal multilevel data: a Monte Carlo study
Cross-classified random effects models (CCREMs) are used in the analyses of cross-sectional and longitudinal multilevel data that are not strictly hierarchical. Because of the complexity of this technique, many researchers ...