dc.contributor.advisor | Kish, Laszlo B. | |
dc.creator | Kim, Jong Un | |
dc.date.accessioned | 2005-08-29T14:36:09Z | |
dc.date.available | 2005-08-29T14:36:09Z | |
dc.date.created | 2003-05 | |
dc.date.issued | 2005-08-29 | |
dc.identifier.uri | https://hdl.handle.net/1969.1/2224 | |
dc.description.abstract | Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 100 million elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of single electron transistor is predicted when a single electron logic processor with the a billion single electron transistors works without error at room temperature. | en |
dc.format.extent | 375771 bytes | en |
dc.format.medium | electronic | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.publisher | Texas A&M University | |
dc.subject | Error rate: Single electron logic: Current-controlled logic | en |
dc.title | Error rate and power dissipation in nano-logic devices | en |
dc.type | Book | en |
dc.type | Thesis | en |
thesis.degree.department | Electrical Engineering | en |
thesis.degree.discipline | Vocational Education | en |
thesis.degree.grantor | Texas A&M University | en |
thesis.degree.name | Master of Science | en |
thesis.degree.level | Masters | en |
dc.contributor.committeeMember | Sanchez-Sinencio, Edgar | |
dc.contributor.committeeMember | Cheng, Mosong | |
dc.contributor.committeeMember | Marlow, William | |
dc.type.genre | Electronic Thesis | en |
dc.type.material | text | en |
dc.format.digitalOrigin | born digital | en |