Resonance fluorescence localization microscopy with sub-wavelength resolution
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The resonance fluorescence spectrum of a number of two-level atoms is driven by a gradient coherent laser field. In the weak dipole-dipole interaction region (separation less than λ/50), a very strong laser field may be applied such that the Rabi frequency is much larger than the dipole-dipole interaction energy. From the spectrum, the positions of each atom may be determined by just a few measurements. This sub-wavelength microscopy scheme is entirely based on far-field technique and it does not require point-by-point scanning, which makes the method more time-efficient. When two atoms are very close to each other (less than λ/50), the position information for each atom may still be obtained with very high accuracy provided that they are not too close to other atoms. The method may be extended to an arbitrarily large region without requiring more peak laser power and only a few measurements are required.
Zubairy, Muhammad Suhail; Liao, Zeyang; Al-amri, Mohammad D. (2015). Resonance fluorescence localization microscopy with sub-wavelength resolution. United States. Patent and Trademark Office; Texas A&M University. Libraries. Available electronically from