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dc.creatorKirk, Wiley P.
dc.creatorZhou X, Joe
dc.creatorGnade, Bruce E.
dc.creatorCho, Chih-chen
dc.date.accessioned2019-06-17T16:56:48Z
dc.date.available2019-06-17T16:56:48Z
dc.date.issued2002-07-16
dc.identifier.urihttps://hdl.handle.net/1969.1/176696
dc.description.abstractA method of forming lattice matched single crystal wide bandgap II-VI compound semiconductor films over a silicon substrate includes first cleaning (10) the silicon substrate. A passivation layer is formed (18), which may comprise arsenic, germanium, or CaF2, among others. The lattice matched layer is then grown (26) on the passivation layer.en
dc.languageeng
dc.publisherUnited States. Patent and Trademark Office
dc.rightsPublic Domain (No copyright - United States)en
dc.rights.urihttp://rightsstatements.org/vocab/NoC-US/1.0/
dc.titleMethod of forming lattice matched layer over a surface of a silicon substrateen
dc.typeUtility patenten
dc.format.digitalOriginreformatted digitalen
dc.description.countryUS
dc.contributor.assigneeTexas Instruments Incorporated
dc.contributor.assigneeTexas A&M University System
dc.identifier.patentapplicationnumber08/340097
dc.subject.uspcprimary117/84
dc.subject.uspcother117/90
dc.subject.uspcother438/761
dc.subject.uspcother438/763
dc.date.filed1994-11-15
dc.publisher.digitalTexas A&M University. Libraries
dc.subject.cpcprimaryC30B 29/48
dc.subject.cpcprimaryC30B 23/02


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