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dc.creatorMendez Rivera, Marcia Gisela
dc.date.accessioned2012-06-07T23:16:21Z
dc.date.available2012-06-07T23:16:21Z
dc.date.created2002
dc.date.issued2002
dc.identifier.urihttps://hdl.handle.net/1969.1/ETD-TAMU-2002-THESIS-M445
dc.descriptionDue to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to digital@library.tamu.edu, referencing the URI of the item.en
dc.descriptionIncludes bibliographical references (leaves 61-63).en
dc.descriptionIssued also on microfiche from Lange Micrographics.en
dc.description.abstractThe number of functions that can be integrated on a single chip has increased during the last years, making the functional testing of circuits a challenging task. Even though the digital testing has reached certain maturity and well-defined techniques have been developed we cannot use the same techniques for analog and mixed-signal circuits due to the different nature of digital and analog circuits. In the case of analog circuits, the number of possible values is unlimited and there is not a specific value that tells us if the circuit is working properly. The complexity and sensitivity of the time and voltage nature in analog circuits makes the testing task even more difficult. Even more, the analog circuits have to be tested under different conditions; e.g., sweeping frequency and amplitude. Due to the fact that there are not specific and efficient techniques for testing analog circuits, every analog circuit requires a particular design in order to be tested. As a result of this, the test cost is the dominant issue in many products and the investment made in this stage is not recovered. This work deals with some of the fundamental problems faced in analog testing. New techniques to characterize and test analog circuits using an external digital tester rather than an analog tester have been developed. The architecture used is a built-in self-test circuit. The test is made in an automatic way, obtaining information that tells us if the circuit works or not based on certain error margin. In our case, the parameters that concern us are transfer function (magnitude and phase response) and harmonic distortion components. The techniques proposed to measure the frequency response of the DUT rely on the capability of the circuit to generate a low distortion and accurate sinusoidal signal to be used as stimuli. The switched-capacitor based circuit techniques used ensure the synchronization between the blocks involved. The use of the same digital signal for controlling these blocks assures that the tracking error could be within 0.5% if switched-capacitor techniques are used.en
dc.format.mediumelectronicen
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherTexas A&M University
dc.rightsThis thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2008. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use.en
dc.subjectelectrical engineering.en
dc.subjectMajor electrical engineering.en
dc.titleOn-chip spectrum/vector analyzer for built-in testing of analog integrated circuitsen
dc.typeThesisen
thesis.degree.disciplineelectrical engineeringen
thesis.degree.nameM.S.en
thesis.degree.levelMastersen
dc.type.genrethesisen
dc.type.materialtexten
dc.format.digitalOriginreformatted digitalen


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